@techreport{
    miche_tech_rep_10_30,
    author = "Miche, Yoan and Bas, Patrick and Lendasse, Amaury",
    bdsk-url-1 = "http://lib.tkk.fi/Reports/2010/isbn9789526032504.pdf",
    responsibleauthor = "Miche, Yoan and Lendasse, Amaury",
    language = "eng",
    corerank = "NA",
    url = "http://lib.tkk.fi/Reports/2010/isbn9789526032504.pdf",
    year = "2010",
    title = "Using Multiple Re-Embeddings For Quantitative Steganalysis and Image Reliability Estimation",
    url_pdf = "http://lib.tkk.fi/Reports/2010/isbn9789526032504.pdf",
    number = "{TKK}-{ICS}-R34",
    month = "June",
    juforank = "NA",
    internalpdf = "isbn9789526032504.pdf",
    flags = "AIRC",
    il = "yes",
    address = "Aalto, Finland",
    date = "2010-06-01",
    unitcode = "T306-100",
    impactfactor = "D4",
    institution = "Aalto University School of Science and Technology"
}