Using Multiple Re-Embeddings For Quantitative Steganalysis and Image Reliability Estimation (2010)
AUTHORS:
Miche Yoan
,
Bas Patrick,
Lendasse Amaury
URL:
http://lib.tkk.fi/Reports/2010/isbn9789526032504.pdf
@techreport{ miche_tech_rep_10_150, author = "Miche, Yoan and Bas, Patrick and Lendasse, Amaury", impactfactor = "D4", title = "Using Multiple Re-Embeddings For Quantitative Steganalysis and Image Reliability Estimation", url = "http://lib.tkk.fi/Reports/2010/isbn9789526032504.pdf", year = "2010", number = "{TKK}-{ICS}-R34", month = "June", responsibleauthor = "Miche, Yoan", corerank = "NA", flags = "AIRC copy", address = "Aalto, Finland", unitcode = "T3060=100", url_pdf = "http://lib.tkk.fi/Reports/2010/isbn9789526032504.pdf", institution = "Aalto University School of Science and Technology" }