@inproceedings{
    PyhHel:ACSD2003,
    editor = "Lilius, Johan and Balarin, Felice and Machado, Ricardo J.",
    author = {Pyh{\"a}l{\"a}, Tuomo and Heljanko, Keijo},
    publisher = "IEEE Computer Society",
    title = "Specification Coverage Aided Test Selection",
    url = "http://users.ics.tkk.fi/kepa/publications/",
    booktitle = "Proceeding of the 3rd International Conference on Application of Concurrency to System Design (ACSD'2003)",
    year = "2003",
    corerank = "B",
    abstract = "In this paper test selection strategies in formal conformance testing are considered. As the testing conformance relation we use the ioco relation, and extend the previously presented on-the-fly test generation algorithms for ioco to include test selection heuristic based on a specification coverage metric. The proposed method combines a greedy test selection with randomization to guarantee completeness. As a novel implementation technique we employ bounded model checking for lookahead in greedy test selection.",
    month = "June",
    juforank = "1",
    flags = "SA-53695 SA-LO-00-02",
    address = "Guimaraes, Portugal",
    keywords = "conformance testing, coverage, bounded model checking",
    pages = "187--195"
}