Harnessing Biased Faults in Attacks on ECC-based Signature Schemes (2012)
AUTHORS:
Järvinen Kimmo
,
Blondeau Céline
,
Page Dan,
Tunstall Michael
BOOKTITLE:
Proceedings of the 9th Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC~2012
PAGES:
72--82
@inproceedings{ fdtc2012, author = {J{\"a}rvinen, Kimmo and Blondeau, C{\'e}line and Page, Dan and Tunstall, Michael}, publisher = "IEEE Computer Society", eventtime = "September 9", isbn = "978-0-7695-4843-0", language = "eng", title = "Harnessing Biased Faults in Attacks on {ECC}-based Signature Schemes", eventlocation = "Leuven, Belgium", country = "United States", booktitle = "Proceedings of the 9th Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC~2012", corerank = "NA", responsibleauthor = {Kimmo J{\"a}rvinen}, juforank = "NA", flags = "public CRYPTO copy", il = "yes", year = "2012", unitcode = "T306-100", impactfactor = "A4", pages = "72--82" }