@inproceedings{
    fdtc2012_kjarvine,
    author = "Järvinen, Kimmo and Blondeau, C{\'e}line and Page, Dan and Tunstall, Michael",
    publisher = "IEEE Computer Society",
    eventtime = "September 9",
    isbn = "978-0-7695-4843-0",
    language = "eng",
    title = "Harnessing Biased Faults in Attacks on {ECC}-based Signature Schemes",
    url = "http://dx.doi.org/10.1109/FDTC.2012.13",
    country = "United States",
    booktitle = "Proceedings of the 9th Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2012",
    corerank = "NA",
    flags = "CRYPTO",
    responsibleauthor = "Järvinen, Kimmo and Blondeau, Celine",
    eventlocation = "Leuven, Belgium",
    juforank = "NA",
    il = "yes",
    year = "2012",
    internalpdf = "fdtc2012.pdf",
    unitcode = "T306-100",
    impactfactor = "A4",
    pages = "72--82"
}

AUTHORS:

URL:
http://dx.doi.org/10.1109/FDTC.2012.13

INTERNAL PDF:
http://research.ics.aalto.fi/publications/bibdb2012/internal_pdfs/fdtc2012.pdf

AUTHORS:

URL: http://dx.doi.org/10.1109/FDTC.2012.13

INTERNAL PDF: http://research.ics.aalto.fi/publications/bibdb2012/internal_pdfs/fdtc2012.pdf

URL:
http://dx.doi.org/10.1109/FDTC.2012.13

INTERNAL PDF:
http://research.ics.aalto.fi/publications/bibdb2012/internal_pdfs/fdtc2012.pdf