L. Almeida | IST/INESC, Portugal |
S.-I. Amari | RIKEN, Japan |
A. Bell | Interval Research, USA |
J.-F. Cardoso | ENST, France |
A. Cichocki | RIKEN, Japan |
P. Comon | Université de Nice, France |
S. Douglas | Southern Methodist University, USA |
C. Fyfe | University of Paisley, UK |
S. Haykin | McMaster University, Canada |
A. Hyvärinen | Helsinki University of Technology, Finland |
C. Jutten | INPG, France |
J. Karhunen | Helsinki University of Technology, Finland |
S. Kassam | University of Pennsylvania, USA |
V. Koivunen | Helsinki University of Technology, Finland |
T.-W. Lee | Salk Institute, USA |
R.-W. Liu | University of Notre Dame, USA |
P. Loubaton | Université de Marne la Vallée, France |
K.-R. Müller | GMD First, Germany |
B. Olshausen | University of California Davis, USA |
E. Oja | Helsinki University of Technology, Finland |
P. Pajunen | Helsinki University of Technology, Finland |
J. Príncipe | University of Florida, USA |
T. Sejnowski | Salk Institute, USA |
K. Torkkola | Motorola Corporate Research, USA |
J. Tugnait | Auburn University, USA |
L. Xu | The Chinese University of Hong Kong, China |