| L. Almeida | IST/INESC, Portugal |
| S.-I. Amari | RIKEN, Japan |
| A. Bell | Interval Research, USA |
| J.-F. Cardoso | ENST, France |
| A. Cichocki | RIKEN, Japan |
| P. Comon | Université de Nice, France |
| S. Douglas | Southern Methodist University, USA |
| C. Fyfe | University of Paisley, UK |
| S. Haykin | McMaster University, Canada |
| A. Hyvärinen | Helsinki University of Technology, Finland |
| C. Jutten | INPG, France |
| J. Karhunen | Helsinki University of Technology, Finland |
| S. Kassam | University of Pennsylvania, USA |
| V. Koivunen | Helsinki University of Technology, Finland |
| T.-W. Lee | Salk Institute, USA |
| R.-W. Liu | University of Notre Dame, USA |
| P. Loubaton | Université de Marne la Vallée, France |
| K.-R. Müller | GMD First, Germany |
| B. Olshausen | University of California Davis, USA |
| E. Oja | Helsinki University of Technology, Finland |
| P. Pajunen | Helsinki University of Technology, Finland |
| J. Príncipe | University of Florida, USA |
| T. Sejnowski | Salk Institute, USA |
| K. Torkkola | Motorola Corporate Research, USA |
| J. Tugnait | Auburn University, USA |
| L. Xu | The Chinese University of Hong Kong, China |